Company Filing History:
3 out of 164,197 
1 out of 5,671 
Years Active: 2005-2017
Title: The Innovations of Barton E Green
Introduction
Barton E Green is a notable inventor based in Milton, VT (US), recognized for his contributions to the field of radio frequency (RF) testing technologies. With a total of 4 patents to his name, Green has made significant advancements that enhance the efficiency and effectiveness of wafer testing processes.
Latest Patents
One of Green's latest patents is focused on high power radio frequency (RF) in-line wafer testing. This innovative approach involves generating an RF test signal and applying it to a device under test (DUT) in a wafer using a buckling beam probe set with a predefined pitch. The method also includes detecting an output RF signal from the DUT in response to the applied RF test signal and sensing at least one frequency component of the detected output RF signal. Another significant patent is the high-frequency cobra probe, which includes a test device featuring cobra probes and a method of manufacturing. This device consists of a conductive upper plate and a conductive lower plate, with a conductive cobra probe insulated by a dielectric material.
Career Highlights
Throughout his career, Barton E Green has worked with prominent companies such as IBM and Globalfoundries Inc. His experience in these organizations has allowed him to develop and refine his innovative ideas, contributing to the advancement of technology in the semiconductor industry.
Collaborations
Green has collaborated with notable individuals in his field, including Hanyi Ding and John S Ferrario. These partnerships have fostered a collaborative environment that encourages the exchange of ideas and the development of cutting-edge technologies.
Conclusion
Barton E Green's contributions to the field of RF testing and his innovative patents demonstrate his commitment to advancing technology. His work continues to influence the industry and pave the way for future innovations.