Maasbracht, Netherlands

Bart Jacobus Martinus Tiemersma

This inventor holds 1 USPTO granted patent and 4 published patent applications. Top assignee: Asml Netherlands B.v.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Bart Jacobus Martinus Tiemersma. Retrieved from https://idiyas.com/inventor/bart-jacobus-martinus-tiemersma

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Bart Jacobus Martinus Tiemersma: Modular Autoencoder Innovation

Introduction

Bart Jacobus Martinus Tiemersma is an inventor based in Maasbracht, Netherlands. His patent work includes a modular autoencoder model designed to estimate manufacturing process parameters.

Latest Patents

Tiemersma is associated with 1 patent, titled “Modular Autoencoder Model for Manufacturing Process Parameter Estimation.” The invention describes a system that processes multiple inputs, combines them, and reduces their dimensionality into a latent space. It then expands the latent representation to generate approximations of the inputs, while a prediction model uses the latent data to estimate one or more parameters. This modular approach is intended to support parameter estimation in manufacturing processes.

Career Highlights

Tiemersma is associated with ASML Netherlands B.V., a company working in advanced technology and manufacturing. His patent reflects an application of machine-learning architecture to manufacturing process analysis.

Collaborations

The listed coworkers associated with Tiemersma include Alexandru Onose and Remco Dirks. Their names provide context for the professional network connected with his work.

Conclusion

Bart Jacobus Martinus Tiemersma’s patent presents a modular autoencoder approach for estimating manufacturing parameters, connecting latent-space modeling with practical process analysis.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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