Thousand Oaks, CA, United States of America

Barry Donohoe

This inventor holds 1 USPTO granted patent and 1 EPO patent. Top assignee: Amgen Inc.. Active years: 2026.


% Patents Active = 100.0

 

Average Co-Inventor Count = 8.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Barry Donohoe: Innovator in Vial Seal Inspection Technology

Introduction

Barry Donohoe is a notable inventor based in Thousand Oaks, California. He has made significant contributions to the field of vial seal inspection technology. His innovative work focuses on enhancing the accuracy and efficiency of inspecting vial seals, which is crucial in various industries, particularly in pharmaceuticals.

Latest Patents

Barry Donohoe holds 1 patent for his invention titled "Apparatuses, systems and methods for vial seal inspection." This patent describes an apparatus, system, or method that utilizes three-dimensional data to represent at least a portion of a vial seal. The technology incorporates at least one laser triangulation sensor, which improves the inspection process by providing precise measurements and data analysis.

Career Highlights

Barry is currently employed at Amgen Inc., a leading biotechnology company known for its innovative approaches to healthcare. His role at Amgen allows him to apply his expertise in developing advanced inspection technologies that ensure the quality and safety of pharmaceutical products.

Collaborations

Throughout his career, Barry has collaborated with talented professionals, including Osvaldo Perez-Varela and Thomas Clark Pearson. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.

Conclusion

In summary, Barry Donohoe is a dedicated inventor whose work in vial seal inspection technology has the potential to significantly impact the pharmaceutical industry. His innovative approach and collaboration with skilled colleagues highlight his commitment to advancing technology in this critical field.

Profile summary based on public USPTO records.
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