The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 01, 2026
Filed:
Aug. 22, 2022
Applicant:
Amgen Inc., Thousand Oaks, CA (US);
Inventors:
Al Patrick Goodwin, Dunleer, IE;
Joseph Peter Bernacki, Thousand Oaks, CA (US);
Thomas Clark Pearson, Newbury Park, CA (US);
Graham F. Milne, Ventura, CA (US);
Jonathan Parsons, Thousand Oaks, CA (US);
Corey Bishop, Thousand Oaks, CA (US);
Barry Donohoe, Thousand Oaks, CA (US);
Osvaldo Perez-Varela, Guaynabo, PR;
Assignee:
AMGEN INC., Thousand Oaks, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01M 3/38 (2006.01); G01B 11/25 (2006.01); G01N 21/90 (2006.01);
U.S. Cl.
CPC ...
G01M 3/38 (2013.01); G01B 11/2522 (2013.01); G01N 21/909 (2013.01); G01N 2201/0612 (2013.01);
Abstract
An apparatus, system, or method for vial seal inspection may be based on three-dimensional data that is representative of at least a portion of a vial seal. More particularly, apparatuses, systems, and methods for vial seal inspection may include at least one laser triangulation sensor.