This inventor holds 6 USPTO granted patents, plus 2 CIPO patents and 1 EPO patent. Top assignee: Rapiscan Systems, Inc.. Active years: 2015-2024.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2015-2024
Title: Innovations by Balamurugan Sankaranarayanan
Introduction
Balamurugan Sankaranarayanan is an accomplished inventor based in Kent, WA (US). He has made significant contributions to the field of X-ray inspection technologies, holding a total of six patents. His work focuses on enhancing security measures for cargo and light vehicles through innovative systems and methods.
Latest Patents
One of his latest patents is titled "Distributed analysis X-ray inspection methods and systems." This patent discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. The system automatically imports manifest data for each shipment, enabling security personnel to quickly determine the contents of cargo. In cases where there is a mismatch between the cargo contents shown by the manifest data and the X-ray images, the cargo may be withheld for further inspection. The process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated in one embodiment of the invention.
Career Highlights
Balamurugan currently works at Rapiscan Systems, Inc., where he continues to develop innovative solutions for security inspection. His expertise in X-ray inspection technologies has positioned him as a key player in the industry.
Collaborations
He collaborates with talented individuals such as Shehul Sailesh Parikh and Siva Kumar, contributing to the advancement of their projects and innovations.
Conclusion
Balamurugan Sankaranarayanan's work in X-ray inspection technologies exemplifies the impact of innovation in enhancing security measures. His contributions are vital in ensuring the safety and efficiency of cargo inspections.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
