The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 18, 2015

Filed:

Sep. 07, 2012
Applicants:

Shehul Sailesh Parikh, Snoqualmie, WA (US);

Balamurugan Sankaranarayanan, Kent, WA (US);

Jeffery Bryan Abel, Issaquah, WA (US);

Siva Kumar, Fremont, CA (US);

Inventors:

Shehul Sailesh Parikh, Snoqualmie, WA (US);

Balamurugan Sankaranarayanan, Kent, WA (US);

Jeffery Bryan Abel, Issaquah, WA (US);

Siva Kumar, Fremont, CA (US);

Assignee:

Rapiscan Systems, Inc., Torrance, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06T 7/00 (2006.01); G01V 5/00 (2006.01);
U.S. Cl.
CPC ...
G06T 7/0004 (2013.01); G01V 5/0016 (2013.01); G01V 5/0083 (2013.01);
Abstract

The present specification discloses systems and methods for integrating manifest data for cargo and light vehicles with their X-ray images generated during scanning. Manifest data is automatically imported into the system for each shipment, and helps the security personnel to quickly determine the contents of cargo. In case of a mismatch between cargo contents shown by manifest data and the X-ray images, the cargo may be withheld for further inspection. In one embodiment, the process of analyzing the X-ray image of the cargo in conjunction with the manifest data is automated.


Find Patent Forward Citations

Parikh, Shehul. (2015). X-ray inspection system that integrates manifest data with imaging/detection processing (U.S. Patent No. 9111331). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/9111331

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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