Susono, Japan

Ayao Nabeya

This inventor holds 1 USPTO granted patent. Top assignee: Ulvac, Inc.. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ayao Nabeya. Retrieved from https://idiyas.com/inventor/ayao-nabeya

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Ayao Nabeya: Innovator in Film Formation Technology

Introduction

Ayao Nabeya is a notable inventor based in Susono, Japan. He has made significant contributions to the field of film formation technology, particularly through his innovative patent that enhances film thickness uniformity.

Latest Patents

Nabeya holds a patent for a film forming apparatus and film forming method. This invention improves the uniformity of film thickness by utilizing a rotation mechanism that holds a target with a sputtered surface at an inclined angle relative to the substrate's surface. The rotation mechanism supports the target rotatably about an axis extending along the normal of the sputtered surface. During the film formation process, the rotational angle of the target is maintained, allowing for the effective sputtering of a thin film onto the substrate.

Career Highlights

Ayao Nabeya is associated with Ulvac, Inc., a company known for its advancements in vacuum technology and thin film deposition. His work at Ulvac has positioned him as a key player in the development of innovative film formation techniques.

Collaborations

Nabeya has collaborated with notable colleagues, including Kenichi Imakita and Tadashi Morita. Their combined expertise has contributed to the advancement of film formation technologies.

Conclusion

Ayao Nabeya's contributions to film formation technology through his innovative patent demonstrate his commitment to enhancing the field. His work continues to influence advancements in thin film deposition methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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