This inventor holds 3 USPTO granted patents. Top assignee: Kabushiki Kaisha Toshiba. Active years: 1990-1991.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 1990-1991
Title: Ayako Maeda: Innovator in Impurity Measurement Technologies
Introduction
Ayako Maeda is a prominent inventor based in Kawasaki, Japan. She has made significant contributions to the field of impurity measurement technologies, holding a total of 3 patents. Her innovative approaches have advanced the methods used to analyze surface impurities in various materials.
Latest Patents
One of her latest patents is a method of measuring impurities in oxide films using a meltable sample. In this method, an object to be measured is moved relative to a stick prepared by cooling and solidifying a solution into a rod-like shape. The stick is brought into contact with the surface of the object, dissolving any natural oxide film present. After this contact, the solution held at the end of the stick is analyzed chemically to determine the type and amount of impurities on the object's surface. Another notable patent is the impurity measuring method, where a hydrophobic drop is placed on the object's surface and moved to ensure contact with the entire area. Afterward, the drop is recovered and analyzed to measure the kind of element and content of impurities adsorbed on the surface.
Career Highlights
Ayako Maeda is currently employed at Kabushiki Kaisha Toshiba, where she continues to innovate and develop new technologies. Her work has been instrumental in enhancing the accuracy and efficiency of impurity measurement techniques.
Collaborations
Throughout her career, Ayako has collaborated with notable colleagues, including Mokuji Kageyama and Masanobu Ogino. These collaborations have further enriched her research and development efforts.
Conclusion
Ayako Maeda's contributions to impurity measurement technologies exemplify her dedication to innovation in her field. Her patents reflect her commitment to advancing scientific understanding and practical applications in material analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
