Daegu, South Korea

Awais Ahmed

This inventor holds 1 USPTO granted patent and 3 published patent applications. Top assignee: Daegu Gyeongbuk Institute of Science and Technology. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Awais Ahmed. Retrieved from https://idiyas.com/inventor/awais-ahmed-xpgdw473

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Awais Ahmed: Inventor in Three-Dimensional Magnetic Field Measurement

Introduction

Awais Ahmed is an inventor associated with Daegu, South Korea. His work includes a patent for a modular device and system designed to measure and map magnetic fields in three-dimensional space.

Latest Patents

Ahmed is associated with 1 patent: “Three-dimensional magnetic field measurement device and magnetic field mapping system.” The invention uses multiple modules that can extend along the x, y, and z axes. Its design enables real-time measurement of magnetic field data across a three-dimensional space without moving the device. The modular arrangement also allows the measurement area to be enlarged or reduced, while aiming to improve power efficiency and reduce the device’s size and weight.

Career Highlights

Ahmed is associated with the Daegu Gyeongbuk Institute of Science and Technology. His patented work focuses on a configurable approach to three-dimensional magnetic field measurement and mapping.

Collaborations

Ahmed’s listed coworker is Hong Soo Choi. Their association reflects collaborative work connected with magnetic field measurement technology.

Conclusion

Awais Ahmed’s patent presents a modular system for real-time three-dimensional magnetic field measurement, with an emphasis on adaptability, efficiency, and compact design.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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