The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 13, 2026

Filed:

May. 06, 2022
Applicant:

Daegu Gyeongbuk Institute of Science and Technology, Daegu, KR;

Inventors:

Hong Soo Choi, Daegu, KR;

Jun Sun Hwang, Goyang, KR;

Jin Young Kim, Daegu, KR;

Awais Ahmed, Daegu, KR;

Sarmad Ahmad Abbasi, Daegu, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 33/02 (2006.01); G01R 33/00 (2006.01); G01R 33/10 (2006.01);
U.S. Cl.
CPC ...
G01R 33/0206 (2013.01); G01R 33/0005 (2013.01); G01R 33/0047 (2013.01); G01R 33/0094 (2013.01); G01R 33/10 (2013.01);
Abstract

The present invention relates to a three-dimensional magnetic field measurement device comprising a plurality of modules, wherein each of the modules is configured to be extensible in x-axis, y-axis, and z-axis directions, whereby magnetic field data in a three-dimensional space can be measured in real time without moving the device, a measurement area can be easily enlarged and reduced, power efficiency can be improved, and the size and weight of the device can be reduced.


Find Patent Forward Citations

Choi, Hong. (2026). Three-dimensional magnetic field measurement device and magnetic field mapping system (U.S. Patent No. 12761293). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/12761293

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…