Budapest, Hungary

Attila MÁRTON

This inventor holds 1 USPTO granted patent. Top assignee: Semilab Semiconductor Physics Laboratory, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Attila MÁRTON. Retrieved from https://idiyas.com/inventor/attila-márton

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Attila MÁRTON: Inventor of a Safer Mercury Probe

Introduction

Attila MÁRTON is an inventor based in Budapest, Hungary, associated with Semilab Semiconductor Physics Laboratory, Inc. His patent work addresses semiconductor wafer measurement, with a design intended to improve safety when using mercury probes.

Latest Patents

The available information lists 1 patent for MÁRTON: “Mercury Probe Apparatus with Improved Safety.” The invention describes a wafer measurement system with a holder and a capillary probe containing a mercury column that contacts the wafer. Pneumatic controls apply partial vacuum or pressure above the mercury, while positioning and measurement components manage probe placement and assess the wafer’s electrical properties.

The apparatus also includes electrical contacts connected to the mercury column and holder, a mercury container, and a control unit coordinating the pneumatic, positioning, and measurement functions. The probe can move between a measurement position, where the tube is separated from the mercury container, and a mercury-change position, where the tube communicates with the container.

Career Highlights

MÁRTON’s listed patent reflects work on semiconductor testing equipment and the practical challenges of handling mercury in measurement systems. Its design combines probe positioning, electrical measurement, and controlled mercury management in one apparatus.

Collaborations

The provided information associates MÁRTON with Semilab Semiconductor Physics Laboratory, Inc. The patent’s focus on wafer measurement aligns with the company’s semiconductor physics and testing field.

Conclusion

Attila MÁRTON’s patent presents a coordinated approach to semiconductor wafer measurement that incorporates controlled probe movement and mercury handling. It highlights his contribution to equipment designed to make mercury-probe testing safer and more manageable.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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