Atsuyuki Doi

Title: Atsuyuki Doi: Innovator in Semiconductor Testing Technology

Introduction

Atsuyuki Doi is a prominent inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor testing technology. With a total of 3 patents to his name, Doi continues to push the boundaries of innovation in his industry.

Latest Patents

Doi's latest patents include a "Test head and semiconductor wafer test apparatus comprising same." This invention provides a test head capable of suppressing a probe card from bending. The test head comprises a main body having a frame, an interface apparatus that electrically connects a probe card and the test head main body, and a brake unit positioned between the probe card and the frame to transmit a pressing force applied to the probe card to the frame.

Another notable patent is the "Attachment apparatus, test head, and electronic device test system." This apparatus includes an engagement shaft that can engage with the bottom surface of a DSA and is held linearly movable. An air cylinder supplies a drive force for linearly moving the engagement shaft, while a link mechanism transmits the drive force input from the air cylinder by rotary motion.

Career Highlights

Atsuyuki Doi is currently employed at Advantest Corporation, where he continues to develop innovative solutions in semiconductor testing. His work has been instrumental in enhancing the efficiency and reliability of testing processes in the semiconductor industry.

Collaborations

Doi has collaborated with notable colleagues such as Yoshimasa Ito and Takashi Naitou. Their combined expertise has contributed to the advancement of technology in their field.

Conclusion

Atsuyuki Doi is a key figure in semiconductor testing technology, with a focus on developing innovative solutions that improve testing efficiency. His contributions through patents and collaborations highlight his commitment to advancing the industry.