Tokyo, Japan

Atsushi Kiya

This inventor holds 1 USPTO granted patent. Top assignee: Mitsubishi Heavy Industries Limited. Active years: 2017.


% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 3(Granted Patents)


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Innovations by Atsushi Kiya in Radiography Technology

Introduction

Atsushi Kiya is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of radiography through his innovative patent. His work focuses on improving the accuracy and efficiency of defect detection in products.

Latest Patents

Atsushi Kiya holds a patent for a defect judging device, radiography system, and defect judging method. This invention utilizes an image processing device to assess the presence or absence of product defects based on detected-image data obtained from a radiographic device. The system identifies product features in the detected-image data and extracts defect candidates, allowing for precise judgment of product defects based on stored characteristic quantities.

Career Highlights

Atsushi Kiya is associated with Mitsubishi Heavy Industries Limited, where he applies his expertise in radiography technology. His innovative approach has led to advancements in the inspection processes used in various industries.

Collaborations

Atsushi collaborates with talented coworkers, including Akemi Takano and Tsuyoshi Tomita. Their combined efforts contribute to the development of cutting-edge technologies in their field.

Conclusion

Atsushi Kiya's work exemplifies the impact of innovation in radiography technology. His patent demonstrates a commitment to enhancing product inspection methods, ultimately benefiting various industries.

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