Mitsubishi Heavy Industries Limited

Atsushi Kiya

Akemi Takano

Kiichi Sugimoto

Yosuke Fujitomi

Tsuyoshi Tomita

Hidenori Takeda

With an image processing device, a presence/absence of a product defect is judged based on detected-image data obtained by a radiographic device that detects radiation that has passed through a product, which is an inspection subject. With the image processing device, a position of a product feature in the detected-image data is identified based on a shape of the product feature indicated by feature data stored in a storage portion in advance, defect candidates are extracted with reference to the identified product feature in the detected-image data, and the presence/absence of a product defect is judged based on characteristic quantities of product defects indicated by a defect characteristic stored in the storage portion in advance and characteristic quantities of the defect candidates.

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Tokyo, Japan

Atsushi Kiya