Kawasaki, Japan

Atsushi Hattori

This inventor holds 6 USPTO granted patents. Top assignee: Mitutoyo Corporation. Active years: 2017-2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Atsushi Hattori. Retrieved from https://idiyas.com/inventor/atsushi-hattori-womfvi26

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.8

ph-index = 4

Forward Citations = 32(Granted Patents)


Location History:

  • Kanagawa, JP (2017 - 2018)
  • Kawasaki, JP (2023)

Company Filing History:


Years Active: 2017-2023

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6 patents (USPTO):Explore Patents

Title: Atsushi Hattori: Innovator in Image Measuring Technology

Introduction

Atsushi Hattori is a prominent inventor based in Kawasaki, Japan. He has made significant contributions to the field of image measuring devices, holding a total of 6 patents. His work has been instrumental in advancing measurement technology, particularly through his association with Mitutoyo Corporation.

Latest Patents

Among his latest innovations is an advanced image measuring device. This device enhances precision and efficiency in measurement processes, showcasing Hattori's commitment to innovation in the field.

Career Highlights

Hattori's career at Mitutoyo Corporation has been marked by his dedication to developing cutting-edge measurement solutions. His expertise has positioned him as a key figure in the company's research and development efforts.

Collaborations

Throughout his career, Hattori has collaborated with talented individuals such as Ryohei Kanno and Kenji Iwamoto. These partnerships have fostered a creative environment that has led to numerous advancements in measurement technology.

Conclusion

Atsushi Hattori's contributions to image measuring technology reflect his innovative spirit and dedication to excellence. His work continues to influence the industry and inspire future advancements in measurement solutions.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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