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Atsushi Fujiwara

USPTO Granted Patents = 16

Average Co-Inventor Count = 2.4

ph-index = 11

Forward Citations = 354(Granted Patents)

Location History:

Kadoma, JP (1993 - 1995)
Kyoto, JP (1985 - 2001)
Osaka, JP (2002 - 2007)

Company Filing History:

15 out of 27,375

Matsushita Electric Industrial Co., Ltd.

Kabushiki Kaisha Ishida Koki Seisakusho

Years Active: 1985-2007

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16 patents (USPTO):Sort by Forward CitationsExplore Patents

1. 7248503 - Semiconductor nonvolatile storage device (2007-07-24),

2. 7126850 - Semiconductor nonvolatile memory device (2006-10-24),

3. 6999349 - Semiconductor nonvolatile storage device (2006-02-14),

4. 6400622 - Semiconductor memory device (2002-06-04),

5. 6323663 - Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method (2001-11-27),

6. 6005401 - Semiconductor wafer package, method and apparatus for connecting testing (1999-12-21),

7. 5945834 - Semiconductor wafer package, method and apparatus for connecting testing (1999-08-31),

8. 5666049 - Semiconductor testing apparatus, semiconductor testing circuit chip, and (1997-09-09),

9. 5545977 - Reference potential generating circuit and semiconductor integrated (1996-08-13),

10. 5497079 - Semiconductor testing apparatus, semiconductor testing circuit chip, and (1996-03-05),

11. 5475648 - Redundancy semiconductor memory device which utilizes spare memory cells (1995-12-12),

12. 5424629 - Power circuit for a semiconductor apparatus (1995-06-13),

13. 5389841 - Differential transmission circuit (1995-02-14),

14. 5355081 - Method for testing a semiconductor integrated circuit having self (1994-10-11),

15. 5248936 - Semiconductor integrated circuit and a method of testing the same (1993-09-28),

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