IDiyas

For the Inventor, By the Inventor

Kyoto, Japan

Atsushi Fujiwara

USPTO Granted Patents = 16

Average Co-Inventor Count = 2.4

ph-index = 11

Forward Citations = 354(Granted Patents)


Location History:

  • Kadoma, JP (1993 - 1995)
  • Kyoto, JP (1985 - 2001)
  • Osaka, JP (2002 - 2007)

Company Filing History:

goldMedal15 out of 27,375 
 
Matsushita Electric Industrial Co., Ltd.
 patents
silverMedal1 out of 127 
 
Kabushiki Kaisha Ishida Koki Seisakusho
 patents

Years Active: 1985-2007

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16 patents (USPTO):Explore Patents
1. 7248503 - Semiconductor nonvolatile storage device (2007-07-24),
2. 7126850 - Semiconductor nonvolatile memory device (2006-10-24),
3. 6999349 - Semiconductor nonvolatile storage device (2006-02-14),
4. 6400622 - Semiconductor memory device (2002-06-04),
5. 6323663 - Semiconductor wafer package, method and apparatus for connecting testing IC terminals of semiconductor wafer and probe terminals, testing method of a semiconductor integrated circuit, probe card and its manufacturing method (2001-11-27),
6. 6005401 - Semiconductor wafer package, method and apparatus for connecting testing (1999-12-21),
7. 5945834 - Semiconductor wafer package, method and apparatus for connecting testing (1999-08-31),
8. 5666049 - Semiconductor testing apparatus, semiconductor testing circuit chip, and (1997-09-09),
9. 5545977 - Reference potential generating circuit and semiconductor integrated (1996-08-13),
10. 5497079 - Semiconductor testing apparatus, semiconductor testing circuit chip, and (1996-03-05),
11. 5475648 - Redundancy semiconductor memory device which utilizes spare memory cells (1995-12-12),
12. 5424629 - Power circuit for a semiconductor apparatus (1995-06-13),
13. 5389841 - Differential transmission circuit (1995-02-14),
14. 5355081 - Method for testing a semiconductor integrated circuit having self (1994-10-11),
15. 5248936 - Semiconductor integrated circuit and a method of testing the same (1993-09-28),
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