Atsuo Takatori

Title: Atsuo Takatori: Innovator in Delay Fault Testing Technology

Introduction

Atsuo Takatori is a notable inventor based in Kawasaki, Japan. He has made significant contributions to the field of semiconductor testing, particularly in delay fault testing technology. With a total of 3 patents to his name, Takatori's work has had a profound impact on the reliability and quality of semiconductor integrated circuits.

Latest Patents

Takatori's latest patents include the following innovations:

1. Delay fault test quality calculation apparatus

2. Delay fault test quality calculation method

3. Delay fault test pattern generation apparatus

These inventions focus on calculating the delay fault test quality achieved by test patterns applied to semiconductor integrated circuits. The delay fault test quality calculation apparatus comprises a defect distribution extraction unit, a delay fault-layout element information extraction unit, and a weighting unit. It also includes a delay fault test quality calculation unit that computes the delay fault test quality based on various parameters, including delay design information and detection information of the test pattern.

Career Highlights

Throughout his career, Atsuo Takatori has worked with prominent companies in the semiconductor industry. He has been associated with Fujitsu Semiconductor Limited and Toshiba Corporation, where he has contributed to advancements in semiconductor technology.

Collaborations

Takatori has collaborated with notable professionals in his field, including Yasuyuki Nozuyama and Shuji Hamada. Their collective expertise has furthered the development of innovative solutions in semiconductor testing.

Conclusion

Atsuo Takatori's contributions to delay fault testing technology have established him as a key figure in the semiconductor industry. His patents reflect a commitment to enhancing the quality and reliability of integrated circuits. His work continues to influence the field and inspire future innovations.