Atila Ersahin

Title: Atila Ersahin: Innovator in Probe Systems

Introduction

Atila Ersahin is a notable inventor based in Fremont, California. He has made significant contributions to the field of probe systems, holding 2 patents that enhance the inspection processes of devices under test. His innovative approach has led to advancements that streamline and improve the efficiency of testing methodologies.

Latest Patents

Ersahin's latest patents include the "Automatic Probe Configuration Station and Method Therefor." This invention features a probe system designed to facilitate the inspection of devices under test. The system incorporates a storage rack, a probe bar gantry assembly, and a probe assembly that electrically mates with the device under test. Additionally, a robot system is integrated to pick the probe assembly from the storage rack and deliver it to the probe bar gantry. The robot system can also retrieve a probe assembly from the probe bar gantry and return it to the storage rack. The probe assembly includes a clamping assembly for secure attachment and may feature an array of contact pins that connect with conductive pads on the device under test.

Another significant patent is the "Array Test Using the Shorting Bar and High Frequency Clock Signal for the Inspection of TFT-LCD with Integrated Driver IC." This invention involves a first shorting bar that drives the data lines of a TFT array with integrated gate driver circuitry. The system measures pixel voltages after charging all pixels with driving signals applied to the shorting bars. By progressively applying gate voltages and comparing the resulting display pattern to an expected pattern, potential defects can be detected effectively.

Career Highlights

Atila Ersahin is currently employed at Photon Dynamics, Inc., where he continues to innovate and develop advanced testing solutions. His work has significantly impacted the efficiency and accuracy of device inspections in the industry.

Collaborations

Ersahin collaborates with talented professionals such as Mike Jun and Barry McGinley, contributing to a dynamic and innovative work environment.

Conclusion

Atila Ersahin's contributions to probe systems and inspection methodologies demonstrate his commitment to innovation in technology. His patents reflect a deep understanding of the complexities involved in device testing, making him a valuable asset in his field.