The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 11, 2015
Filed:
Jan. 07, 2011
Kent Nguyen, San Jose, CA (US);
Kaushal Gangakhedkar, San Jose, CA (US);
David Baldwin, Atascadero, CA (US);
Nile Light, Livermore, CA (US);
Steve Aochi, Morgan Hill, CA (US);
Yan Wang, Sunnyvale, CA (US);
Atila Ersahin, Fremont, CA (US);
Hai Tran, San Jose, CA (US);
Thomas H. Bailey, San Jose, CA (US);
Kiran Jitendra, San Jose, CA (US);
Alan Cable, San Jose, CA (US);
Dave Smiley, San Jose, CA (US);
Thomas E. Wishard, Santa Cruz, CA (US);
Kent Nguyen, San Jose, CA (US);
Kaushal Gangakhedkar, San Jose, CA (US);
David Baldwin, Atascadero, CA (US);
Nile Light, Livermore, CA (US);
Steve Aochi, Morgan Hill, CA (US);
Yan Wang, Sunnyvale, CA (US);
Atila Ersahin, Fremont, CA (US);
Hai Tran, San Jose, CA (US);
Thomas H. Bailey, San Jose, CA (US);
Kiran Jitendra, San Jose, CA (US);
Alan Cable, San Jose, CA (US);
Dave Smiley, San Jose, CA (US);
Thomas E. Wishard, Santa Cruz, CA (US);
PHOTON DYNAMICS, INC., San Jose, CA (US);
Abstract
A probe system for facilitating the inspection of a device under test. System incorporates a storage rack; a probe bar gantry assembly; a probe assembly configured to electrically mate the device under test; and a robot system for picking the probe assembly from the storage rack and deliver the probe assembly to the probe bar gantry. The robot system is also enabled to pick a probe assembly from the probe bar gantry and deliver the probe assembly to the storage rack. The probe assembly includes a clamping assembly for attaching the probe assembly to the probe bar gantry or the storage rack. The probe assembly may include an array of contact pins configured to mate with conductive pads on the device under test when the probe assembly is installed on the probe bar gantry assembly.