Meylan, France

Assem Sadek


Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Assem Sadek: Innovator in Ordinal Regression

Introduction

Assem Sadek is a prominent inventor based in Meylan, France. He has made significant contributions to the field of machine learning, particularly in the area of ordinal regression. His innovative approach has led to the development of a unique method that enhances the performance of machine learning models.

Latest Patents

Assem Sadek holds a patent for a method of unsupervised domain adaptation in ordinal regression. This patent describes a method for jointly training a transferable feature extractor network, an ordinal regressor network, and an order classifier network. The process involves providing a source of labeled source images and unlabeled target images, outputting image representations through a minimax optimization procedure, and training various networks to improve the accuracy of ordinal regression tasks. This method is particularly valuable for applications where labeled data is scarce.

Career Highlights

Assem Sadek is currently employed at Naver Corporation, where he continues to push the boundaries of innovation in machine learning. His work has garnered attention for its practical applications and theoretical advancements. With a focus on developing robust algorithms, he has established himself as a key figure in his field.

Collaborations

Assem collaborates with Boris Chidlovskii, leveraging their combined expertise to further enhance their research and development efforts. Their partnership exemplifies the importance of teamwork in driving innovation.

Conclusion

Assem Sadek's contributions to the field of ordinal regression through his patented method demonstrate his commitment to advancing machine learning technologies. His work at Naver Corporation and collaborations with fellow innovators highlight the collaborative spirit that fuels progress in this dynamic field.

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