Oakland, CA, United States of America

Asikeh Kanu

This inventor holds 1 USPTO granted patent. Top assignee: Kumetrix, Inc.. Active years: 2005.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Asikeh Kanu. Retrieved from https://idiyas.com/inventor/asikeh-kanu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 30(Granted Patents)


Company Filing History:


Years Active: 2005

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1 patent (USPTO):Explore Patents

Title: Asikeh Kanu: Innovator in Microsampling Technology

Introduction

Asikeh Kanu is a notable inventor based in Oakland, CA. He has made significant contributions to the field of microsampling technology. His innovative work has led to the development of a unique patent that enhances optical measurements in analytical processes.

Latest Patents

Asikeh holds a patent for a "Silicon nitride window for microsampling device and method of construction." This invention features a silicon nitride cuvette window that allows for optical measurements on analytes contained within the cuvette. The microsampling device draws the sample to be analyzed into the cuvette, facilitating accurate and efficient analysis.

Career Highlights

Asikeh Kanu is currently employed at Kumetrix, Inc., where he continues to push the boundaries of technology in his field. His work at the company reflects his commitment to innovation and excellence in microsampling solutions.

Collaborations

Asikeh collaborates with talented individuals such as Kumar Subramanian and Wilson Smart. Their combined expertise fosters a creative environment that drives advancements in their projects.

Conclusion

Asikeh Kanu's contributions to microsampling technology exemplify the impact of innovative thinking in scientific research. His patent and ongoing work at Kumetrix, Inc. highlight his role as a key player in the advancement of analytical methods.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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