The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 6896850 B1

PDF
Full Text
Expired
Date of Patent:
May. 24, 2005

Filed:

Mar. 26, 2001
Applicants:

Kumar Subramanian, Pleasanton, CA (US);

Wilson Smart, Palo Alto, CA (US);

Asikeh Kanu, Oakland, CA (US);

Inventors:

Kumar Subramanian, Pleasanton, CA (US);

Wilson Smart, Palo Alto, CA (US);

Asikeh Kanu, Oakland, CA (US);

Assignee:

Kumetrix, Inc., Union City, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L003/00 ;
U.S. Cl.
CPC ...
Abstract

A silicon nitride cuvette window for a microsampling device and method of construction are provided. The sample to be analyzed is drawn into the cuvette of the microsampling device. The silicon nitride window permits optical measurements to be made on analytes contained within the cuvette.


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Subramanian, Kumar. (2005). Silicon nitride window for microsampling device and method of construction (U.S. Patent No. 6896850). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6896850

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