San Jose, CA, United States of America

Ashwin Ramakrishnan

This inventor holds 1 USPTO granted patent. Top assignee: Kla Corporation. Active years: 2023.


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Ashwin Ramakrishnan: Innovator in Unsupervised Defect Segmentation

Introduction

Ashwin Ramakrishnan is a notable inventor based in San Jose, CA. He has made significant contributions to the field of inspection systems, particularly in the area of unsupervised defect segmentation. His innovative approach has the potential to enhance the accuracy and efficiency of defect detection in various applications.

Latest Patents

Ashwin holds a patent for an inspection system that utilizes unsupervised defect segmentation. This system receives inspection datasets from a defect inspection system associated with one or more samples. The inspection dataset includes values of two or more signal attributes and values of one or more context attributes. The system labels each dataset with a class label based on their positions in a defined signal space. Furthermore, it segments the datasets into defect groups by training a classifier with the context attributes and corresponding class labels.

Career Highlights

Ashwin Ramakrishnan is currently employed at Kla Corporation, where he applies his expertise in developing advanced inspection technologies. His work focuses on improving defect detection processes, which are crucial for maintaining quality in manufacturing and production environments. With a patent portfolio that includes 1 patent, he continues to push the boundaries of innovation in his field.

Collaborations

Some of Ashwin's coworkers include Erfan Soltanmohammadi and Mohit Jani. Their collaborative efforts contribute to the advancement of technologies in defect inspection and segmentation.

Conclusion

Ashwin Ramakrishnan is a pioneering inventor whose work in unsupervised defect segmentation is shaping the future of inspection systems. His contributions are vital for enhancing quality control in various industries.

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