Menlo Park, CA, United States of America

Asghar Nafarieh

This inventor holds 31 USPTO granted patents and 6 EPO patents, primarily in Document Image Processing. Top assignee: Xerox Corporation. Active years: 2001-2013.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Asghar Nafarieh. Retrieved from https://idiyas.com/inventor/asghar-nafarieh

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 45.2


Average Co-Inventor Count = 2.7

ph-index = 12

Forward Citations = 499(Granted Patents)


Company Filing History:


Years Active: 2001-2013

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Areas of Expertise:
Document Classification
Skew Detection
MRC Technology
Image Segmentation
Digital De-Screening
Image Compression
Background Detection
Adaptive Quantization
Color Adjustment
Thresholding
Image Data Organization
Halftone Estimation
31 patents (USPTO):Explore Patents

Title: The Innovative Mind of Asghar Nafarieh

Introduction: Asghar Nafarieh is a visionary inventor based in Menlo Park, CA, known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Asghar Nafarieh holds several patents in the areas of artificial intelligence, machine learning, and renewable energy technologies, showcasing his commitment to creating a sustainable future.

Career Highlights: With a career spanning over two decades, Asghar Nafarieh has worked with leading tech companies, research institutions, and universities to develop cutting-edge solutions that have revolutionized the industry.

Collaborations: Throughout his career, Asghar Nafarieh has collaborated with top engineers, scientists, and researchers from around the world, fostering a culture of innovation and excellence in all his projects.

Conclusion: Asghar Nafarieh's passion for innovation and his relentless pursuit of technological advancement continue to inspire the next generation of inventors and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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