The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 16, 2012
Filed:
Jan. 30, 2009
Applicant:
Asghar Nafarieh, Menlo Park, CA (US);
Inventor:
Asghar Nafarieh, Menlo Park, CA (US);
Assignee:
Xerox Corporation, Norwalk, CT (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method and system for skew detection is provided using connected components analysis. The methodology includes extracting connected components corresponding to the image and analyzing the image based on said connected components for determining skew of the image.
Nafarieh, Asghar. (2012). Method and system for skew detection of a scanned document using connected components analysis (U.S. Patent No. 8290302). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8290302
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile