Tucson, AZ, United States of America

Artur Olszak

This inventor holds 29 USPTO granted patents and 1 published patent application and 2 EPO patents, primarily in Spectrally Controlled Interferometry. Top assignees: Dmetrix, Inc., Apre Instruments, Inc., Veeco Instruments Inc.. Active years: 2002-2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Artur Olszak. Retrieved from https://idiyas.com/inventor/artur-olszak

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 29 

% Patents Active = 58.6

 

Average Co-Inventor Count = 1.5

ph-index = 9

Forward Citations = 358(Granted Patents)


Company Filing History:


Years Active: 2002-2020

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Areas of Expertise:
Spectrally Controlled Interferometry
Optical Alignment
Imaging Systems
Wavelength Shifting
Position Measurement
Optical Coherence Tomography
Multi-Spectral Scanning
Liquid-Lens Optics
Heterodyne Techniques
Non-Contact Probes
Array Microscope
Reference Signal Correction
29 patents (USPTO):Explore Patents

Title: The Innovative Mind of Artur Olszak

Introduction: Artur Olszak, a talented inventor based in Tucson, AZ, is known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Artur Olszak holds several patents in the areas of artificial intelligence, renewable energy, and medical devices, showcasing his diverse range of expertise.

Career Highlights: With a career spanning over two decades, Artur Olszak has worked with leading tech companies, research institutions, and universities, consistently pushing the boundaries of what is possible in the world of invention.

Collaborations: Throughout his career, Artur Olszak has collaborated with top engineers, scientists, and designers, fostering a culture of creativity and innovation in all his projects.

Conclusion: Artur Olszak's passion for innovation and his relentless drive to create a better future through his inventions make him a true pioneer in the world of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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