The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 24, 2019

Filed:

Apr. 23, 2018
Applicant:

Apre Instruments, Llc, Tucson, AZ (US);

Inventor:

Artur Olszak, Tucson, AZ (US);

Assignee:

APRE INSTRUMENTS, INC., Tucson, AZ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01J 9/02 (2006.01); G03F 9/00 (2006.01); G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
G01J 9/02 (2013.01); G01B 9/02004 (2013.01); G01B 9/02068 (2013.01); G03F 9/7049 (2013.01); G01J 2009/0253 (2013.01);
Abstract

In order to align the various components of an instrument, the beam produced by a spectrally-controlled light source is aligned with the optical axis of the instrument and the first component is placed at its predetermined position along the optical axis. Then, configuring the spectral modulation of the source such that one surface of the component is used as the reference surface, the spectrum of the source is modulated so as to produce a correlogram formed by reflections from the reference surface and from the other surface of the optical component. The correct alignment of the component is determined by adjusting its position so as to cause the correlogram to conform to the bullseye configuration that meets predetermined design parameters. The procedure is repeated with each other component of the instrument, the alignment of each component being based on interference fringes created independently of other components.


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