Sunnyvale, CA, United States of America

Arpana Jayaswal

This inventor holds 1 USPTO granted patent. Top assignee: Oracle America, Inc.. Active years: 2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arpana Jayaswal. Retrieved from https://idiyas.com/inventor/arpana-jayaswal

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 22(Granted Patents)


Company Filing History:


Years Active: 2012

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1 patent (USPTO):Explore Patents

Title: Arpana Jayaswal and Software Performance Profiling

Introduction

Arpana Jayaswal is an inventor associated with Sunnyvale, California. Her patent work addresses ways to organize and display software performance data so developers can better investigate application behavior.

Latest Patents

The provided information lists one patent associated with Jayaswal: “Method and Apparatus for Sorting and Displaying Costs in a Data Space Profiler.” The invention describes a graphical interface for sorting, aggregating, filtering, and displaying profile data linked to runtime events in a software application. Users can select different perspectives and presentation options, including panning and zooming, to examine costs and related code attributes. These capabilities are intended to help identify performance bottlenecks and their causes. The supplied data reports 1 patent.

Career Highlights

Jayaswal is associated with Oracle America, Inc. The patent reflects work on tools for analyzing software performance, with an emphasis on making complex profiling information easier to explore.

Collaborations

The supplied information names Martin S. Itzkowitz and Nicolai Kosche as Jayaswal’s coworkers. Their inclusion indicates professional connections, though the provided details do not specify their roles in the patent.

Conclusion

Arpana Jayaswal’s listed invention focuses on presenting software profiling costs in flexible, filterable views, helping users investigate application performance and locate potential bottlenecks.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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