The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 24, 2012
Filed:
Sep. 07, 2006
Nicolai Kosche, San Francisco, CA (US);
Arpana Jayaswal, Sunnyvale, CA (US);
Martin S. Itzkowitz, Redwood City, CA (US);
Nicolai Kosche, San Francisco, CA (US);
Arpana Jayaswal, Sunnyvale, CA (US);
Martin S. Itzkowitz, Redwood City, CA (US);
Oracle America, Inc., Redwood City, CA (US);
Abstract
A data space profiler may include a graphical user interface (GUI) for sorting, aggregating and displaying profile data associated with runtime events of a profiled software application. This profile data may include costs associated with events as well as extended address elements and other code behavior attributes associated with them. The GUI may include means for selecting a perspective from which cost data is to be presented as well as presentation options for displaying the data. The presentation options may include panning and zooming options, which may determine how the data is sorted and/or aggregated for display. The GUI may also include means for specifying filter criteria, which may be used to determine which data to display. By providing means to alternate the display of profile data according to different perspectives and filtering criteria, the GUI may facilitate identification of performance bottlenecks of the profiled application and the causes thereof.