Jerusalem, Israel

Arnon Houri Yafin

This inventor holds 19 USPTO granted patents and 6 published patent applications, plus 2 CIPO patents and 5 EPO patents, primarily in Biological Sample Analysis. Top assignee: S.d. Sight Diagnostics Ltd.. Active years: 2016-2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Arnon Houri Yafin. Retrieved from https://idiyas.com/inventor/arnon-houri-yafin

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 19 

% Patents Active = 94.7

 

 

Average Co-Inventor Count = 4.8

ph-index = 6

Forward Citations = 169(Granted Patents)


Company Filing History:


Years Active: 2016-2026

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Areas of Expertise:
Classification Models
Optical Measurements
Blood Sample Imaging
Entity Detection
Bodily Sample Analysis
Staining-Quality Parameter
Red Blood Cell Deformity
Measurement Methods
Sample Analysis
Defect Detection
19 patents (USPTO):Explore Patents

Title: The Innovative Mind of Arnon Houri Yafin

Introduction: Arnon Houri Yafin, a talented inventor hailing from Jerusalem, Israel, is known for his groundbreaking contributions to the field of technology and innovation.

Latest Patents: Arnon Houri Yafin holds several patents in various technological domains, showcasing his versatility and creativity in inventing new solutions to complex problems.

Career Highlights: Throughout his illustrious career, Arnon Houri Yafin has worked tirelessly to push the boundaries of innovation, leading to the development of cutting-edge technologies that have revolutionized industries.

Collaborations: Arnon Houri Yafin has collaborated with top research institutions, leading companies, and brilliant minds in the field, fostering a culture of innovation and excellence in all his projects.

Conclusion: Arnon Houri Yafin's passion for innovation, coupled with his relentless drive to create, has solidified his position as a visionary inventor whose work continues to inspire and shape the future of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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