The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 24, 2023

Filed:

Sep. 30, 2021
Applicant:

S.d. Sight Diagnostics Ltd., Tel Aviv, IL;

Inventors:

Yochay Shlomo Eshel, Sde Warburg, IL;

Natalie Lezmy, Hod Hasharon, IL;

Dan Gluck, Kadima, IL;

Arnon Houri Yafin, Jerusalem, IL;

Joseph Joel Pollak, Neve Daniel, IL;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06V 20/69 (2022.01); G06T 7/00 (2017.01); G02B 21/36 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
G02B 21/367 (2013.01); G01N 21/8851 (2013.01); G02B 21/365 (2013.01); G06T 7/0012 (2013.01); G06V 20/693 (2022.01); G06V 20/698 (2022.01); G01N 2021/8887 (2013.01); G06T 2207/10056 (2013.01); G06T 2207/30024 (2013.01); G06T 2207/30101 (2013.01);
Abstract

Apparatus and methods are described for analyzing a bodily sample. One or more microscope images of the bodily sample are acquired. Using at least one computer processor at least one sample-informative feature that is indicative of a characteristic of the bodily sample is extracted from the images. Based upon the sample-informative feature, the computer processor determines that there is a defect associated with the bodily sample, and determines a source of the defect. Other applications are also described.


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