Lagundo, Italy

Armando Giannattasio

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Armando Giannattasio: Innovator in Silicon Structure Defect Detection

Introduction

Armando Giannattasio is a notable inventor based in Lagundo, Italy. He has made significant contributions to the field of semiconductor technology, particularly in the detection of defects in silicon structures. His innovative approach has implications for the manufacturing and quality assurance processes in the semiconductor industry.

Latest Patents

Giannattasio holds a patent for "Methods for detecting defects in a single crystal silicon structure." This patent describes a process for identifying defects in single crystal silicon structures that are doped with elements such as antimony, boron, arsenic, or phosphorus. The method involves immersing the structure in an ultrasonic bath, applying a first etchant solution containing nitric acid and hydrofluoric acid to create an etched surface, and then coating this surface with a metal that can diffuse through silicon. After annealing the structure to facilitate the diffusion of the metal, a second etchant solution is used to delineate defects in the silicon structure. This innovative method enhances the ability to detect and address defects, thereby improving the quality of silicon-based products.

Career Highlights

Giannattasio's career is marked by his dedication to advancing semiconductor technology. His work has been instrumental in developing methods that enhance the reliability and performance of silicon structures. His patent reflects his commitment to innovation and excellence in the field.

Collaborations

Throughout his career, Giannattasio has collaborated with esteemed colleagues, including Fabrizio Nicolini and Silvana Zampieri. These collaborations have contributed to the advancement of research and development in semiconductor technologies.

Conclusion

Armando Giannattasio's contributions to the field of semiconductor technology, particularly through his patented methods for detecting defects in silicon structures, highlight his role as an innovator. His work continues to influence the industry and improve the quality of silicon-based products.

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