Kyoto, Japan

Aoi Mochizuki

This inventor holds 1 USPTO granted patent. Top assignee: Omron Corporation. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Aoi Mochizuki. Retrieved from https://idiyas.com/inventor/aoi-mochizuki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Aoi Mochizuki: Innovator in Component Inspection Technology

Introduction

Aoi Mochizuki is a talented inventor based in Kyoto, Japan. She has made significant contributions to the field of component inspection technology. Her innovative approach has led to the development of a unique device that enhances the accuracy and efficiency of product inspections.

Latest Patents

Aoi holds a patent for a component inspection device. This device includes a storage section that stores images of non-defective products. It also features a generation section that creates images of defective products using a machine learning model. Additionally, there is a setting section that allows users to set parameters for component inspection. The output section performs inspections using the stored non-defective images and the generated defective images, ultimately providing an inspection result.

Career Highlights

Aoi Mochizuki is currently employed at Omron Corporation, a leading company in automation and control technology. Her work at Omron has allowed her to apply her innovative ideas in a practical setting, contributing to advancements in the industry.

Collaborations

Aoi collaborates with talented coworkers, including Shimpei Fujii and Shinji Sugita. Their teamwork fosters a creative environment that drives innovation and enhances the development of new technologies.

Conclusion

Aoi Mochizuki is a remarkable inventor whose work in component inspection technology exemplifies the power of innovation. Her contributions continue to shape the future of product inspections, making processes more efficient and reliable.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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