The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 16, 2026

Filed:

Mar. 09, 2021
Applicant:

Omron Corporation, Kyoto, JP;

Inventors:

Aoi Mochizuki, Kyoto, JP;

Shimpei Fujii, Kyoto, JP;

Shinji Sugita, Kyoto, JP;

Assignee:

OMRON Corporation, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01);
U.S. Cl.
CPC ...
G06T 7/001 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01); G06T 2207/30141 (2013.01);
Abstract

A component inspection device including: a storage section configured to store at least a non-defective product images; a generation section configured to generate a defective product image using a machine learning model; a setting section configured for a user to set a parameter for component inspection; and an output section configured to perform inspection, by using the parameter, on the non-defective product image stored in the storage section and the defective product image generated by the generation section, the output section being configured to output an inspection result.


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