Anupama Aniruddha Agashe

Title: Anupama Aniruddha Agashe: Innovator in SoC Design and Testing

Introduction

Anupama Aniruddha Agashe is a prominent inventor based in Maharashtra, India. She has made significant contributions to the field of integrated circuit design and testing. With a total of 3 patents to her name, her work focuses on enhancing the efficiency and reliability of System on Chip (SoC) designs.

Latest Patents

Anupama's latest patents include innovative solutions such as at-speed ATPG testing and an apparatus for SoC designs that utilize multiple clock domains through a VLCT test platform. This patent describes a scan test circuitry design embedded within an SoC, featuring a scan architecture that supports multiple scan test ports. The design includes at least one scan chain group that receives test stimulus data, with each group having a corresponding test mode signal. This allows for the shifting of test stimulus data at a clock rate derived from its specific clock domain. Additionally, a controlling demultiplexer connects to each multiplexer unit within the scan chain group to provide control signals for data shifting. The clock control mechanism enhances the testing process by enabling simultaneous capture of data across multiple scan chain groups.

Another notable patent focuses on a system and method that enhance the observability of integrated circuit failures during burn-in tests. This innovation monitors scan automatic test pattern generation and memory built-in self-test patterns during burn-in tests, allowing for selective observation of scan chain outputs and memory BIST status outputs.

Career Highlights

Anupama Agashe is currently employed at Texas Instruments Corporation, where she continues to push the boundaries of technology in integrated circuit design. Her work has been instrumental in developing advanced testing methodologies that improve the reliability of electronic devices.

Collaborations

Throughout her career, Anupama has collaborated with talented professionals, including Nikila Krishnamoorthy and Rubin Ajit Parekhji. These collaborations have fostered an environment of innovation and creativity, leading to groundbreaking advancements in the field.

Conclusion

Anupama Aniruddha Agashe is a trailblazer in the realm of SoC design and testing. Her innovative patents and contributions to Texas Instruments Corporation highlight her commitment to advancing technology. Her work not only enhances the efficiency of integrated circuits but also sets a benchmark for future innovations in the industry.