The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 10, 2006
Filed:
Sep. 22, 2003
Applicants:
Gordhan Barevadia, Richardson, TX (US);
Anupama Aniruddha Agashe, Pune, IN;
Nikila Krishnamoorthy, Bangalore, IN;
Rubin Ajit Parekhji, Bangalore, IN;
Neil J. Simpson, Rockwall, TX (US);
Inventors:
Gordhan Barevadia, Richardson, TX (US);
Anupama Aniruddha Agashe, Pune, IN;
Nikila Krishnamoorthy, Bangalore, IN;
Rubin Ajit Parekhji, Bangalore, IN;
Neil J. Simpson, Rockwall, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method enhance observability of IC failures during burn-in tests. Scan automatic test pattern generation and memory built-in self-test patterns are monitored during the burn-in tests to provide a mechanism for observing selective scan chain outputs and memory BIST status outputs.