Espoo, Finland

Antti Pelli


 


Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 11(Granted Patents)


Company Filing History:


Years Active: 2021-2023

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4 patents (USPTO):Explore Patents

Title: Antti Pelli: Innovator in X-ray Fluorescence Analysis

Introduction

Antti Pelli is a notable inventor based in Espoo, Finland. He has made significant contributions to the field of X-ray fluorescence analysis, holding a total of 4 patents. His work focuses on developing advanced analytical systems that enhance the accuracy and efficiency of material analysis.

Latest Patents

Antti Pelli's latest patents include an innovative X-ray fluorescence analyzer and a method for performing X-ray fluorescence analysis. The X-ray fluorescence analyzer features an X-ray tube that emits incident X-rays along a first optical axis. It includes a slurry handling unit designed to maintain a constant distance between the sample of slurry and the X-ray tube. A first crystal diffractor is strategically positioned to separate a predefined wavelength range from fluorescent X-rays, directing them to a radiation detector. The system is designed with an input power rating of at least 400 watts and utilizes a pyrolytic graphite crystal for optimal performance. The energy resolution of the radiation detector is better than 600 eV, ensuring precise analysis of elements with atomic numbers between 41 and 60.

Career Highlights

Throughout his career, Antti Pelli has worked with prominent companies such as Outotec Oy and Oxford Instruments Analytical Oy. His experience in these organizations has contributed to his expertise in developing cutting-edge analytical technologies.

Collaborations

Antti has collaborated with talented individuals in his field, including Tommi Koskinen and Heikki Sipilä. These partnerships have fostered innovation and advancement in X-ray fluorescence analysis.

Conclusion

Antti Pelli's contributions to the field of X-ray fluorescence analysis demonstrate his commitment to innovation and excellence. His patents and career achievements reflect his significant impact on material analysis technologies.

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