The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 14, 2022

Filed:

Apr. 20, 2018
Applicant:

Outotec (Finland) Oy, Espoo, FI;

Inventors:

Tommi Koskinen, Espoo, FI;

Antti Pelli, Espoo, FI;

Heikki Sipilä, Espoo, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01); G21K 1/06 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G21K 1/06 (2013.01); G01N 2223/616 (2013.01); G21K 2201/062 (2013.01);
Abstract

An X-ray fluorescence analyzer includes an X-ray tube for emitting incident X-rays in the direction of a first optical axis. A slurry handling unit is configured to maintain a constant distance between a sample of slurry and the X-ray tube. A first crystal diffractor is located in a first direction from the slurry handling unit and configured to separate a predefined first wavelength range from fluorescent X-rays that propagate into the first direction. The first crystal diffractor is configured to direct the fluorescent X-rays in the separated predefined first wavelength range to a first radiation detector. The first crystal diffractor includes a pyrolytic graphite crystal that has a diffractive surface, which is a simply connected surface. The first radiation detector is a solid-state semiconductor detector.


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