The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 20, 2023

Filed:

Feb. 18, 2019
Applicant:

Outotec (Finland) Oy, Espoo, FI;

Inventors:

Heikki Sipilä, Espoo, FI;

Antti Pelli, Espoo, FI;

Tommi Koskinen, Espoo, FI;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 23/223 (2006.01);
U.S. Cl.
CPC ...
G01N 23/223 (2013.01); G01N 2223/616 (2013.01);
Abstract

An X-ray fluorescence analyzer system including an X-ray tube, a slurry handling unit, and a crystal diffractor located in a first direction from the slurry handling unit. The crystal diffractor separates a predefined wavelength range from fluorescent X-rays that propagate into the first direction, and directs the fluorescent X-rays in the separated predefined wavelength range to a radiation detector. The crystal diffractor includes a pyrolytic graphite crystal. The predefined wavelength range includes characteristic fluorescent radiation of a pre-defined element of interest with its atomic number Z between 41 and 60, the ends included. An energy resolution of the radiation detector is better than 600 eV at the energy of the characteristic fluorescent radiation.


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