Tampellan, Finland

Antti Manninen

This inventor holds 1 USPTO granted patent. Top assignee: Smartrac I.p. B.v.. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Antti Manninen. Retrieved from https://idiyas.com/inventor/antti-manninen-vhqol6v5

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 36(Granted Patents)


Company Filing History:


Years Active: 2015

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Antti Manninen: Innovator in Radio Frequency Identification Technology

Introduction

Antti Manninen is a notable inventor based in Tampellan, Finland. He has made significant contributions to the field of technology, particularly in the area of radio frequency identification (RFID). His innovative work has led to the development of a unique RFID sticker, which has practical applications in various industries.

Latest Patents

Antti Manninen holds 1 patent for his invention of a radio frequency identification (RFID) sticker. This technology enhances the ability to track and manage items efficiently, making it a valuable asset in logistics and inventory management.

Career Highlights

Antti is currently employed at Smartrac I.P. B.V., a company known for its advancements in RFID technology. His role at Smartrac allows him to further develop and refine his inventions, contributing to the company's reputation as a leader in the industry.

Collaborations

Antti collaborates with his coworker, Tuomas Koskelainen, to drive innovation and improve the functionality of their products. Their teamwork exemplifies the spirit of collaboration in the tech industry.

Conclusion

Antti Manninen's contributions to RFID technology highlight his role as an influential inventor. His work continues to impact various sectors, showcasing the importance of innovation in today's technological landscape.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…