Helsinki, Finland

Antti Haapalainen

This inventor holds 1 USPTO granted patent. Top assignee: Ou Eliko Tehnoloogia Arenduskeskus. Active years: 2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Antti Haapalainen. Retrieved from https://idiyas.com/inventor/antti-haapalainen

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2014

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1 patent (USPTO):Explore Patents

Title: Antti Haapalainen: Innovator in Multichannel Multifrequency Analysis

Introduction

Antti Haapalainen is a notable inventor based in Helsinki, Finland. He has made significant contributions to the field of multichannel multifrequency analysis. His innovative approach has led to the development of a unique method and device that enhances the analysis of various objects.

Latest Patents

Antti holds a patent for a "Method and device for multichannel multifrequency analysis of an object." This method involves applying a set of excitation signals to an object and sampling the response signal using both uniform and non-uniform undersampling techniques. The non-uniform sampling is performed for two or more different frequencies within a single observation time slot. Additionally, uniform sampling is conducted for multiple channels within the same observation time slot, allowing for a comprehensive analysis of the object's response.

Career Highlights

Antti is currently associated with Ou Eliko Tehnoloogia Arenduskeskus, where he continues to innovate and develop new technologies. His work has garnered attention for its practical applications in various fields, showcasing his expertise and dedication to advancing technology.

Collaborations

Antti collaborates with talented individuals such as Mart Min and Paul Annus, contributing to a dynamic work environment that fosters innovation and creativity.

Conclusion

Antti Haapalainen's contributions to multichannel multifrequency analysis exemplify his commitment to innovation and technology. His patent and ongoing work continue to influence the field positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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