The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 08, 2014
Filed:
Apr. 24, 2007
Mart Min, Tallinn, EE;
Paul Annus, Tallinn, EE;
Alar Kuusik, Tallinn, EE;
Raul Land, Tallinn, EE;
Toomas Parve, Tallinn, EE;
Ants Ronk, Tallinn, EE;
Antti Haapalainen, Helsinki, FI;
Mart Min, Tallinn, EE;
Paul Annus, Tallinn, EE;
Alar Kuusik, Tallinn, EE;
Raul Land, Tallinn, EE;
Toomas Parve, Tallinn, EE;
Ants Ronk, Tallinn, EE;
Antti Haapalainen, Helsinki, FI;
OÜ Eliko Tehnoloogia Arenduskeskus, Tallinn, EE;
Abstract
A method for multichannel multifrequency analysis of an object, applying a set of excitation signals to the object and sampling the response signal from the object, using uniform and non-uniform undersampling. Non-uniform sampling of the response signal is performed, i.e., the sampling is performed for two or more different frequencies in one observation time slot. Also, uniform sampling of the response signal is performed, i.e., the sampling of a signal, corresponding to one frequency, is performed for two or more channels within one observation time slot and then sampling the same signal for another frequency for two or more channels within the next observation time slot.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile