Miami, FL, United States of America

Anthony Giordano

This inventor holds 1 USPTO granted patent. Top assignee: Florida International University. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anthony Giordano. Retrieved from https://idiyas.com/inventor/anthony-giordano-krsnyaap

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Anthony Giordano: Innovator in Inline Process Monitoring

Introduction

Anthony Giordano is a notable inventor based in Miami, FL (US). He has made significant contributions to the field of manufacturing through his innovative patent. His work focuses on enhancing the precision and efficiency of manufacturing processes.

Latest Patents

Giordano holds a patent for an "Inline monitoring system for process defects during manufacturing." This invention provides systems and methods for inline process monitoring, including remote monitoring for scalable and precision high-yield manufacturing. The technology utilizes antenna probes, such as millimeter wave (mmWave) antenna probes, to detect hidden conductor and dielectric defects, as well as misalignments in via-pad and device pad-trace. This advancement goes beyond traditional automated optical inspection (AOI) or contact probing methods.

Career Highlights

Anthony Giordano is affiliated with Florida International University, where he continues to contribute to research and development in manufacturing technologies. His expertise in inline monitoring systems positions him as a key figure in the advancement of manufacturing processes.

Collaborations

Giordano collaborates with talented individuals such as Markondeyaraj Pulugurtha and Satheesh Bojja Venkatakrishnan, enhancing the innovative capabilities of his projects.

Conclusion

Anthony Giordano's work in inline process monitoring represents a significant step forward in manufacturing technology. His contributions are paving the way for more efficient and precise manufacturing processes.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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