Anshuman Chandra

Title: Anshuman Chandra: Innovator in Integrated Circuit Testing

Introduction

Anshuman Chandra is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of integrated circuit testing, particularly through his innovative patent. His work focuses on enhancing the efficiency and effectiveness of testing methodologies for integrated circuits.

Latest Patents

Anshuman Chandra holds a patent for a "Wrapper cell design and built-in self-test architecture for 3DIC test and diagnosis." This patent describes systems, methods, and devices for performing intra-die and inter-die tests of one or more dies of an integrated circuit. The design includes a cell that features a data register, an I/O pad, and a first multiplexer. The data register is configured to output a signal, while the I/O pad is coupled to the data register and is designed to receive and buffer the signal. The first multiplexer is connected to both the I/O pad and the data register, allowing it to selectively output either the buffered signal or the original signal based on the enabled mode, whether scan or functional.

Career Highlights

Anshuman Chandra is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His role involves working on advanced technologies that push the boundaries of integrated circuit design and testing.

Collaborations

Anshuman collaborates with various professionals in his field, including his coworker, Sandeep Kumar Goel. Their combined expertise contributes to the innovative projects at their company.

Conclusion

Anshuman Chandra's contributions to integrated circuit testing through his patent demonstrate his commitment to innovation in the semiconductor industry. His work continues to influence the development of more efficient testing methodologies for integrated circuits.