This inventor holds 1 USPTO granted patent. Top assignee: Lumafield, Inc.. Active years: 2026.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2026
Title: Anne Winnefeld Sandman and AI-Based X-Ray Anomaly Detection.
Introduction
Anne Winnefeld Sandman is an inventor associated with Lumafield, Inc., and is based in Los Altos Hills, California. Her patent work concerns applying artificial intelligence to X-ray computed tomography data to identify anomalies in scanned objects.
Latest Patents
Sandman is named on 1 patent: “Artificial Intelligence Anomaly Detection Using X-Ray Computed Tomography Scan Data.” The patent describes methods and systems that derive information about interior structures from CT scans and provide that information to a machine-learning model trained on scans of objects of the same type. The model’s output can indicate a detected anomaly, prompting an output to a physical device.
Career Highlights
Her listed invention brings together industrial CT imaging and machine learning. By analyzing derived scan data, the approach is designed to help detect irregularities within objects that may not be visible from their exterior.
Collaborations
Sandman’s listed company affiliation is Lumafield, Inc. Her named coworkers include Daniel Micah Pipe-Mazo and Andreas Linas Bastian.
Conclusion
Anne Winnefeld Sandman’s patent highlights an application of artificial intelligence to CT-based inspection, using machine-learning analysis to identify potential anomalies inside scanned objects.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile