The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 16, 2026
Filed:
Apr. 17, 2025
Lumafield, Inc., Cambridge, MA (US);
Andreas Linas Bastian, San Francisco, CA (US);
Daniel Micah Pipe-Mazo, Redondo Beach, CA (US);
Anne Winnefeld Sandman, Los Altos Hills, CA (US);
Lumafield, Inc., Cambridge, MA (US);
Abstract
Provided herein are methods, apparatuses, computer program products, and systems for anomaly detection using machine learning models. One method can include obtaining X-ray computed tomography (CT) scan data for a scan object of a predetermined object type; producing derived data from the X-ray CT scan data, wherein the derived data reveals at least one interior structure usable for anomaly detection in objects of the predetermined object type; inputting at least the derived data into a machine learning model, which has been trained using at least derived data produced from prior X-ray CT scan data for objects of the predetermined object type; receiving an output from the machine learning model that indicates that at least one anomaly has been detected for the scan object; and providing an output to a physical device based on the at least one anomaly having been detected for the scan object.