Andreas Linas Bastian

Title: Andreas Linas Bastian and His Patented Innovations

Introduction

Andreas Linas Bastian is an inventor based in San Francisco, California. His patent work focuses on applying computed tomography and machine learning to inspection and analysis tasks. He is associated with Lumafield, Inc., and holds 2 patents.

Latest Patents

Bastian’s listed patents address anomaly detection in X-ray computed tomography data and seed quality analysis using computed tomography.

“Artificial Intelligence Anomaly Detection Using X-Ray Computed Tomography Scan Data” describes methods and systems that use machine learning to identify anomalies in objects from CT scan data. The approach derives data that reveals interior structures, analyzes it with a model trained on scans of similar objects, and provides an output to a physical device when an anomaly is detected.

“Seed Quality Analysis Using Computed Tomography” describes a system for assessing seedlings in computed tomography data of a germination towel. It detects likely seeds and candidate shoots and roots, groups image segments into plant structures, assembles likely seedlings, and classifies the towel using a trained classifier.

Career Highlights

Bastian’s listed inventions apply CT imaging to two distinct areas: detecting anomalies in scanned objects and evaluating seed quality. Both use computational analysis to interpret internal structures and produce actionable results.

Collaborations

Bastian is associated with Lumafield, Inc. His listed coworkers include Steven Thomas and Anne Winnefeld Sandman.

Conclusion

Andreas Linas Bastian’s patents demonstrate how computed tomography and machine learning can support automated inspection and seed analysis.