Richmond, VT, United States of America

Ann L Swift

This inventor holds 1 USPTO granted patent. Top assignee: International Business Machines Corporation. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ann L Swift. Retrieved from https://idiyas.com/inventor/ann-l-swift

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: Ann L. Swift: Innovator in Semiconductor Testing

Introduction

Ann L. Swift is an accomplished inventor based in Richmond, Vermont, known for her significant contributions to the field of semiconductor testing. She holds a remarkable patent that showcases her innovative approach to enhancing testing methodologies.

Latest Patents

Ann L. Swift has one patent to her name: a "Diversified Exerciser and Accelerator." This invention is a method, apparatus, and computer program product designed to test semiconductor products through a combination of various techniques. The unique aspect of her invention lies in its ability to adaptively emphasize different testing techniques based on specific requirements. By tweaking the application methods, higher single defect acceleration parameters can be achieved, thereby overcoming the limitations of traditional 'Burn In' testing.

Career Highlights

Ann is associated with IBM (International Business Machines Corporation), a leading player in the information technology industry. Her work significantly impacts the testing processes of semiconductor products, enabling better performance assessments and reliability.

Collaborations

Throughout her career, Ann L. Swift has collaborated with notable colleagues such as David A. Grosch and Gregory V. Miller, who have contributed to her work in advancing semiconductor testing techniques.

Conclusion

As an inventor, Ann L. Swift stands out for her innovative contributions to the semiconductor industry, proving that combining multiple testing techniques can lead to enhanced outcomes. Her patent not only showcases her ingenuity but also reflects the importance of adaptability in technological advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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