Singapore, Singapore

Anish Priyadarshi

This inventor holds 1 USPTO granted patent. Top assignee: Nanyang Technological University. Active years: 2009.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Anish Priyadarshi. Retrieved from https://idiyas.com/inventor/anish-priyadarshi

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2009

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1 patent (USPTO):Explore Patents

Title: Anish Priyadarshi: Innovator in Strain Sensing Technology

Introduction

Anish Priyadarshi is a notable inventor based in Singapore, recognized for his contributions to the field of strain sensing technology. He has developed a unique patent that showcases his innovative approach to detecting strain on various specimens.

Latest Patents

Anish holds a patent for a moiré interferometric strain sensor. This advanced sensor is designed to detect strain on a specimen, utilizing a diffraction grating placed on the specimen. The strain sensor features an array of multiple microlenses that receive at least one reflected beam from an incident beam directed at the specimen. Additionally, it includes a detector array positioned at the focal plane of the microlens array, enhancing its sensitivity and accuracy.

Career Highlights

Anish Priyadarshi is affiliated with Nanyang Technological University, where he contributes to research and development in innovative technologies. His work in the field of strain sensing has positioned him as a key figure in advancing this area of study.

Collaborations

Anish collaborates with esteemed colleagues such as Anand Krishna Asundi and Subodh Gautam Mhaisalkar, further enriching his research endeavors and fostering innovation in the field.

Conclusion

Anish Priyadarshi's work exemplifies the spirit of innovation in strain sensing technology. His contributions are paving the way for advancements that could have significant applications in various industries.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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