The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 13, 2009
Filed:
Sep. 27, 2005
Applicants:
Anand Krishna Asundi, Singapore, SG;
Anish Priyadarshi, Singapore, SG;
Subodh Gautam Mhaisalkar, Singapore, SG;
Inventors:
Anand Krishna Asundi, Singapore, SG;
Anish Priyadarshi, Singapore, SG;
Subodh Gautam Mhaisalkar, Singapore, SG;
Assignee:
Nanyang Technological University, Singapore, SG;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/24 (2006.01); G01B 9/02 (2006.01); G01D 5/36 (2006.01);
U.S. Cl.
CPC ...
Abstract
A moiré interferometric strain sensor for detecting strain on a specimen, a diffraction grating being on the specimen, the strain sensor including an array of a plurality of microlenses for receiving at least one reflected beam of at least one incident beam upon the specimen; and a detector array at a focal plane of the array of a plurality of microlenses.